Test System Migration – Replacing or Upgrading Obsolete Test Systems2019-02-05T14:08:39-05:00

test system migrationTest System Migration – Replacing and upgrading obsolete test systems

Problems you may be experiencing:

  • Old/failing hardware

  • Out-dated operating system

  • Un-maintainable tester software

  • Test data silos

  • Test time too long

  • Platinum level National Instruments Alliance Partner

  • We’ve updated over 200 obsolete test systems

You have an existing test system.

  • Maybe it is on its last legs because of some obsolete components which, once the last one fails, will kill the tester.
  • Maybe the UUT design has been upgraded enough times that the system can no longer properly test the latest version.
  • Maybe IT is forcing you to upgrade your OS.
  • Maybe you’ve got an old rats nest of legacy code that you need ported to a more modern version or language.

You need to upgrade that system.  But not just any replacement: it has to act like the existing one.

You want to be sure the automated test system upgrade:

  • Operates “just like” the original system

  • Accommodates desired new functionality

  • Minimizes rework of any fixture/UUT harnesses and connections

Ideally, you’d like to push the new test system into the same place as the old one and just hit the proverbial go button.

You’re probably worried about the lack of documentation on the old tester: there are no drawings of the signal connections and no write-up on the exactly how the tests are performed. And, you likely have a budget challenge.

I want to update my obsolete test system »

How We’ve Helped Our Clients

We notice that our clients have a nagging concern (fear?) about moving away from something that still works. By reviewing and understanding the possible differences in performance between old and updated systems, any differences can be minimized or justified. We have managed these differences by:

stop-production

Magnifying glass over footsteps on grey background

  • Performing a thorough reverse engineering to understand the nuances and details of the old system so the new system matches the old as closely as reasonably possible
  • Making sure that the reverse engineering includes operator usage as well as the functionality, in order to remove or reduce operator re-training and possible associated quality issues
  • Assessing and addressing possible unexpected increases in reject rates associated with the (typically) better capabilities in the new measurement equipment as compared to the old equipment, since often the faster and more accurate new equipment uncovers previously unknown behaviors in product performance
  • Working through any mismatches between new and old harnesses and connections to maintain familiarity in using the test equipment
  • Reviewing the new capabilities so that they won’t mess up the old ones

old-vs-new

Often, the most challenging part of these is explaining why the new test system is “correct” when producing different results than the old system. We help you make and understand these assessments. Sometimes, the only option is making the new hardware and software act like the old equipment.

Case Studies

Pump Test Station Used Across Multiple Locations Worldwide

Pump Test Station Used Across Multiple Locations Worldwide

Simplifies gathering test data from multiple plants to perform site-to-site comparisons

Client – Large Pump Manufacturer

Challenge

Our customer needed an updated test system to replace their obsolete/unmaintainable test systems. It was too hard to gather data from multiple sites located around the world, certain algorithms weren’t standardized, and they didn’t have the ability to utilize the test systems to calculate first-pass yield at each site.

Solution

Viewpoint developed a new pump test application that harmonizes the user interface, calculations, and test procedures, resulting in enhanced operational efficiency and tracking of the manufacturing process. Furthermore, it is used in multiple global locations with language localization and support for the varying hardware already in place at each site. The new application deposits all the test data from the various sites into a single database for engineering and manufacturing data analysis at corporate headquarters.

Benefits

  • Simplifies gathering test data (for analysis) from multiple plants worldwide to perform site-to-site comparisons.
  • Enables calculation of first-pass yield for each manufacturing plant.
  • Standardizes algorithms for pump performance summary data calculation for first-pass yield and site comparison analysis.
  • Abstracts the hardware to support differences in control and measurement hardware at each site and provides a future path to homogenize hardware installations.

System Overview

The entire system consists of three main applications:

  1. A database management application to allow the user to update test configurations and to enter and associate new pump serial numbers with specific tests.
  2. A pump test data acquisition application that can run up to 5 different tests simultaneously on the UUT, generating a datafile for each test that is also stored in the database.
  3. An application to generate reports from the information stored in the database to provide to customers when delivering a new pump or after a factory witness test.

Measurements include:

  • Flow
  • Pressure
  • Vibration
  • Displacement
  • Temperature
  • Torque

All hardware was provided by the customer.

SOFTWARE FUNCTIONS
Test database manager
Pump test data acquisition
Pump test sequencer
Pump test pass/fail calculations
Report Generator
Test Data Exporter
HARDWARE USED & INTERFACED
NI cDAQ
Multiple NI cSeries measurement modules
Various PLCs
Various motor controllers

Custom Test System Using NI PXI for Electrical Test

Custom Test System Using NI PXI for Electrical Test

Updating an obsolete tester that maintains functionality

Client – Medical Device Manufacturer

Challenge

Our client already had a test system in place, but the tester (really two test systems testing two different product variants) was becoming obsolete.  The tester was old, hardware was failing, and it was getting harder and harder to keep it reliably running.  They wanted a new tester to improve reliability, but maintain the functionality of the existing tester to keep the FDA-mandated verification and validation time to a minimum.

Solution

The updated end-of-line manufacturing test system maintains the functionality of the old test systems, but with updated hardware and software.  The same software is utilized for both the manual test system update and the automated test system update.  Our client deployed 6 manual testers and 1 automated tester.

Benefits

  • Improved maintainability and reliability with updated hardware and software
  • Maintains existing test system functionality to keep certification time down

System Overview

There were two variants of the new test system.  One was for an older product line that utilized manual test, with an operator that connected/disconnected the UUT, and initiated the test.  The other was an automated tester, integrated into a manufacturing machine.  Both testers utilized custom fixtures (provided by the client), off-the-shelf NI measurement hardware (selected by Viewpoint), and custom test software (developed by Viewpoint).  The software is configurable for both the manual test system and the automated test system.

SOFTWARE FUNCTIONS
Read UUT limits from config file
Perform tester self-test
Measure impedance
Power UUT
Pressurize UUT
Measure UUT output
Perform leak down pressure test
PLC interface (for automated tester) for start, done, pass, fail
HARDWARE USED
Custom test fixture (provided by client)
NI PXI
PXI Multifunction I/O Module
PXI Digital I/O Module
PXI Relay Module
PXI Digital Multimeter Module
PXI Switch Matrix Module

*- images are conceptual, not actual

Endurance Tester for Mission-Critical Mechanical Component using NI cRIO

Endurance Tester for Mission-Critical Mechanical Component using NI cRIO

Ability to run tests unattended and overnight reduces operator labor and compresses test schedules

Client – Major Aerospace Component Supplier / Manufacturer

Challenge

The client had an older VB & PLC-based test system in place already, but it was obsolete. A new endurance test system needed to be developed to validate prototyped components (in this case, aircraft & aerospace bearings). Many of the prototypes are one-off, so it was important that the test system not destroy the component.

Solution

A new endurance test system was developed to validate prototyped components. The test system can be configured for automatic shutdowns so as not to destroy the component under test in the event of unexpected performance of electro-mechanical subsystem components. The updated endurance tester supports product validation by allowing the product to run under various test conditions (e.g. speed, load, oil flow, temperature) and collecting data for analysis.

Viewpoint developed the software and selected the NI hardware (other hardware was selected by the client).

Benefits

  • Ability to run tests unattended and overnight eases operator labor and compresses test schedules

  • Data collection allows for offline engineering analysis

  • Automatic shutdowns reduce destruction of the prototype component under test

System Overview

The updated cRIO-based endurance tester incorporates configurable profiles, data logging, and automatic shutdown to allow for safer extended validation testing.  LabVIEW FPGA and LabVIEW RT were used together to interface with the test hardware sensors and controls.  LabVIEW as used create the HMI for the test system.

SOFTWARE FUNCTIONS
Closed loop control of bearing test oil flow
Axial load control
Driver for Emerson VFD
E-Stop and safety management (shutdowns based on alarm limits)
Data collection – temperature, pressure, flow, vibration, frequency
Operator/Diagnostic GUI for control of system
HARDWARE USED
NI CompactRIO (cRIO)
NI C Series Current Input Module
NI C Series Voltage Input Module
NI C Series Temperature Input Module
NI C Series Current Output Module
NI C Series Analog Input Module
NI C Series Sound and Vibration Input Module
NI C Series Digital Module
Emerson VFD (Variable Frequency Drive)
INTERFACES / PROTOCOLS
TCP/IP
TCP Modbus
HAVE A SIMILAR CHALLENGE? GET A TEST SYSTEM CONSULTATION »

Endurance Tester using NI cRIO

Endurance Tester using NI cRIO

Multiple International Deployments Helps Prove Product Meets Spec.

Each endurance test can run upwards of 6 months.

Client: Major Automotive Component Supplier

Challenge

A new endurance test system was developed to give more precision in the control setpoint. This additional precision enabled potential clients to review the product performance in real-life situations.  Each endurance test can run upwards of 6 months.

Solution

The updated endurance tester supports product validation by providing the desired parameter control method, allowing the client to prove more obviously that their part met the stated specification.

Viewpoint developed the software and selected the NI hardware for the first unit.  The client is now deploying copies of this system to multiple international manufacturing plants.

Benefits

  • Able to prove meeting a particular product specification of interest
  • Closed loop parameter control
  • Data collection
  • Configurable Alarms
  • Emergency shutdown functionality

System Overview

The cRIO-based endurance tester provides closed loop control, data collection, and alarming with controlled and emergency shutdown functions.  The operator can manually configure a test or load a saved configuration.  After a manual operator check to make sure the setup is operating correctly, a successful test will run its full duration and stop on its own.

SOFTWARE FUNCTIONS
Touch PC interface / GUI
Closed loop parameter control
Data collection
Controlled & emergency shutdown
Alarming
HARDWARE USED
NI CompactRIO
NI analog input cSeries module
NI analog output cSeries module
NI digital input cSeries module
NI digital output cSeries module
INTERFACES / PROTOCOLS
TCP
Yes, I’d like to chat about my test system needs »

Product Validation using LabVIEW RT & LabVIEW FPGA – Electromechanical Actuator Test Stand

Product Validation using LabVIEW RT & LabVIEW FPGA – An electromechanical actuator test stand

Automated testing reduces operator man hours and increases production throughput.

Client – A manufacturer of actuators in the mil-aero industry.

Challenge

New Product Introduction (in this case a new controller and new actuators) drove the need for a new automated electromechanical test stand.

Solution

New NI PXI-based electromechanical test equipment provided automated testing, report generation, and SPC data generation.  The sequencing of the test procedure, reporting, and verifiable results were managed with the StepWise test executive platform.

Benefits

  • Automated testing reduces operator man hours and increases production throughput.
  • Meets strict customer requirements regarding testing and data recording in a verifiable manner.
  • Automated Test Report Generation.
  • Collects data to support SPC (Statistical Process Control).
  • Ability to obtain the internal state of the controller FPGA via the LVDS communication link.

System Overview

Viewpoint developed the software and selected NI data acquisition and control hardware for the test stand.  There are several layers of software functionality.

HOST LABVIEW SOFTWARE LAYER
Test sequencer
Test steps (e.g. Frequency Response, Step Response, Dynamic Stiffness, Fault Response, Power Consumption)
Test Report Generator
GUI
REAL-TIME (RT) LABVIEW SOFTWARE LAYER
Data acquisition
1553 comms
Function generator
Error detection
ESTOP
LABVIEW FPGA SOFTWARE LAYER
Synch data from 3 sources (tester, UUT, external DAQ device)
Stream high-speed data to disk
Stream high-speed data to analog outputs for engineering use
Custom communication protocol used by UUT over LVDS lines
HARDWARE RECOMMENDED
NI PXIe
NI FlexRIO card with LVDS adapter module
Multiple NI R Series cards
High speed, high voltage, isolated analog input cards
INTERFACES / PROTOCOLS
MIL-STD 1553 bus
LVDS
Ethernet
Custom TCP/IP

*- images are conceptual only, not actual

Yes, I need an automated test system »

Increasing Test System Automation for Existing Tester to handle Production Volume Demand Increase

Increasing Test System Automation for Existing Tester to handle Production Volume Demand Increase

Reduced test time across several products by an average of ~25% and reduced time to create paperwork by ~3x

Client

Manufacturer of high-voltage power supplies

Challenge

The client already had an existing manufacturing test system in place. They wanted Viewpoint to enhance the tester due to an increase in production volume demand.  Viewpoint reviewed the existing test system and noted 3 areas for improvement:

  1. Automation available in the measurement instruments – most of the test equipment was automatable, via some combination of serial, GPIB, or Ethernet interfaces. Furthermore, some equipment, such as an oscilloscope, had the ability to store and recall setup configurations. The test operators already used these configurations to decrease setup time for the next test step. Most test equipment did not have automated setup.
  2. Operator time spent on each test step – the client had been through a Lean assessment and had already done a good job of timing operations. However, we specifically noted that the operator was manually connecting to the test points and manually transcribing to paper the measurement results from instrument displays.
  3. Automating the connections – many types of product models were being tested at this test system. Connecting the test equipment to all sorts of products would require either 1) many types of test harnesses and connectors or 2) a redesign of the products to make test connections simpler and quicker.

Solution

The enhanced automated test system included automation of instrumentation interfaces, a test executive to run the test sequences, automated test report generation, and automated test data archiving for the electronic UUT.

Benefits

  • Reduced total test time across several products by an average of ~25%.
  • Time to create paperwork was reduced by ~2/3 due to automated data collection.

System Overview

The enhanced test system included the following updates:

  • Test sequence automation
  • Automated test report generation
  • Automated test data archiving
  • Automation of instrumentation interfaces
  • Configurable automated test steps associated with each type of measurement instrument. The test operators would create a sequence of steps to setup each instrument and record the resulting measurement. The sequence of steps could be saved and recalled for each product to be tested, so the instruments could be used automatically.
  • New programmable meter – integrated the new DMM meter with a programmable interface to replace the one that was not automatable.
  • Foot switch integration – Since the connections to the test points were manual, a foot switch allowed the operator to take the measurement and advance to the next step.

The StepWise test executive platform managed the multiple test procedures created for the different products. StepWise also handled creation of HTML reports for every part tested.

SOFTWARE FUNCTIONS
Test GUI
Test Sequencer
Report Generator
Test Data Archiving
Instrument interfaces
Yes, I need to increase my level of automation »

Product Validation & Production Test System – For complex Mission-critical sub-system

Product Validation & Production Test System – For complex Mission-critical sub-system

Client

Ensign-Bickford Aerospace & Defense

Upgrade reduces per unit test time by ~40% and improves reliability of software

Challenge

The customer needed to upgrade their existing test system.  Their old test system was very manual:

  • It did not provide ability for unattended operation
  • The thermal control had to be set manually
  • They wanted to do less manual review of the data

The client develops mission-critical products, so there’s a desire to reduce manual operations because they have to explain any anomalies, and manual operations are typically more error-prone.  They needed repeatable results that they could trust.

Solution

Viewpoint developed a new test system that utilized new hardware and software, augmented by existing low level hardware and firmware.  The test system was developed to perform both functional test for production and environmental testing, and was designed to handle up to 4 DUTs at once. The test system utilizes the StepWise test executive software with custom test steps, which allowed the client to create their own highly configurable test sequences.  The system was developed in two phases, with the second phase adding support for a FPGA expansion backplane (NI CompactRIO chassis) in order to provide future capability for bringing some of the microcontroller sequence activity into the NI space. In addition, the previous version had a mix of serial, TTL, and USB instrumentation, which was not as robust as Ethernet based instrumentation. Phase II involved upgrading to all Ethernet based instrumentation, and did away with the original test system’s many manual toggle switches that could be used instead of the programmable mode through the SW.

Benefits

  • ~40% test time reduction per unit
  • ~25% reduction in anomalies that needed to be justified
  • ~500 manhours saved in test execution

System Overview

Software Functions
Test sequencing
Test report generation
Data recording/logging
Error handling
Test GUI
Oscilloscope interface
Thermal chamber interface
Power supply interface
External custom hardware interface
I need an automated test system »

Custom Manufacturing Inspection System – with Machine vision and Advanced Motion Control

Custom Manufacturing Inspection System

with Machine Vision and Advanced Motion Control

Client – Xerox

Challenge

Our client had an old manufacturing inspection system (really two systems: one inspection system and an assembly/inspection system) that would no longer be supported by IT and was going to be removed from the network. They needed the operating system updated, so they decided to take this as an opportunity to port the old code from VB to C#.NET, as well as update some hardware.

As migration projects often do, this effort began by working with the client to solidify requirements, followed by a reverse engineering effort to understand the old system to try to make it match the new system as much as possible.

Solution

The updated manufacturing inspection system (one inspection system and an assembly/inspection system) included a new operating system, ported code, new motion control software, new machine vision software, and a new GUI.

Benefits

  • OS Update – Updated operating system that is supported by the IT department and is less of a security risk
  • Software Porting – Ported software to more maintainable language
  • Measurement Accuracy – Increased inspection measurement accuracy for sub-set of measurements
  • New GUI – improved operator user experience by improving readability, reducing # of required button clicks, and adding auto scroll functionality
  • Report Generation – maintained existing format to interface with customer database

System Overview

The device under inspection is essentially an image sensor array used for scanning images in high end commercial-grade scanning printers.  The inspection system utilizes machine vision and precision motion control to verify the location & orientation of several parts, with measurement accuracy measured in microns.

SOFTWARE FUNCTIONS
Vision / metrology – pattern match and inspection
Camera interface
Motion controller interface
Command Recipe Decoder
Report Generation
Camera Calibration
Robot Controller Command Interface
GUI
HARDWARE (SELECTED & SUPPLIED BY CLIENT)
Cognex camera
ACS motion control system
2-Dimensional Cartesian Robot & Controller
Inspection fixture
Power Supplies
INTERFACES
EtherCAT
Modbus/TCP

Manufacturing Test – for mission-critical components

PXIe

Manufacturing Test – for mission-critical components

 

Using PXI & LabVIEW RT

Client: A major manufacturer of implantable cardiac and neural stimulators

Challenge

Our client needed several extremely reliable test systems to test the batteries that power their implantable medical devices. These new test systems were needed for two main reasons. First, the needed to upgrade existing obsolete test equipment, based on antiquated hardware and software. Second, new battery designs could not be tested on the old equipment.

A critical aspect of the new test system was the need to detect any excessive charge being extracted from the battery, thus rendering it unsuitable for surgical implantation. Thus, the test system needed to monitor the total energy withdrawn from a battery during testing to assure that it never exceeded a certain limit while also offering precise control of the type of pulses being drained from a battery.

All test results had to be stored in a database in order to maintain device history for each battery manufactured for archiving, quality control, and process improvements.

Solution

PXIe

The updated manufacturing test system is PXI-based along with a custom micro-controller-based circuit board for some low-level control. Each PXI controller communicated to the microcontroller (uC) on the custom PCB via CAN. The uC controlled the current drain from the battery while monitoring actual current and voltage from the battery at over 1000 samples per second using a precision 6.5 digit PXI DMM. Additionally, each PXI chassis was used to test many hundreds of batteries. Signal connections were handled by several switch multiplexers. Overall control of all the PXI testers was managed by a host PC connected to the PXI controller.

Benefits

  • Reduced test system cost vs complete COTS solution with combo LabVIEW RT on PXI and firmware on microcontroller-based custom circuit board
  • Enabled tight control of DUT operation on controller with microsecond level responsiveness while being supervised by higher-level PXI RT
  • Quick-reaction test abort capability
  • Test results stored to database for archiving, quality control, and process improvements

System Overview

In a simplified view, the testing proceeded by pulsing the battery with a series of different durations and varying amperages. The exact sequence of this pulsing is unique for each DUT model. Measurements were made using a PXI filled with various NI boards such as DMMs, for accuracy, and data acquisition cards, for general purpose use.

Additionally, the pulsing amperage levels needed to be tightly controlled in order to know that the tests have been performed properly. Thus, a real-time amperage control scheme had to be implemented to maintain the level requested for the pulse. We chose to accomplish this control via an analog control circuit developed using a custom Viewpoint-developed circuit board. This board was controlled via a Microchip PIC microprocessor. The LabVIEW RT application communicated with the microcontroller to setup the pulsing sequence and coordinate the start and stop of the pulsing and the NI acquisition hardware.

This custom circuitry also reduced the overall cost of the test system by about 40%.

The engineering time to design this custom circuitry was more than offset by the reduction in material costs because more than 10 test systems were deployed, allowing the non-recurring engineering effort to be shared between many systems.

When no critical issues were detected, the waveforms acquired by the PXI system were stored and then analyzed to determine the viability of the DUT. The pass/fail disposition, the waveforms, the total energy consumed, and other test results were then passed along to a master PC that managed all these results in a database for archiving, quality control, and process improvements, each set of results being tied to the unique unit serial number.
The test systems provided reliable operation for testing the large annual production volumes of the mission-critical DUTs.

SOFTWARE FUNCTIONS
LabVIEW RT – for managing the microcontroller functions and overall data collection and safety monitoring
Microcontroller application – to provide precision pulsing of the batteries
Communicate to the host PC – to both receive pulsing instructions and configurations and to return pulse waveforms for each battery tested.
MAIN HARDWARE COMPONENTS
PXI chassis & controller
PXI DMM
PXI analog input modules
SCXI multiplexing switches
INTERFACES / PROTOCOLS:
Ethernet TCP-IP
CAN
HAVE A SIMILAR CHALLENGE? GET A TEST SYSTEM CONSULTATION »

Manufacturing Test System for Electrical Components

Manufacturing Test System for Electrical Components

Replacing Obsolete Custom Electronics with cRIOs in High-Power Capacitor Testing

Modular Embedded cRIO Systems Shortens Development and Reduces Risk in Complex PC-based Test System

Client: A major manufacturer of electrical power generation and distribution equipment.

Problem Scope

This project involved retrofitting a test system used to verify operation of a high-power capacitor used in electrical power distribution. This system was originally built around 1990. Critical sections of the original test system relied on custom, wire-wrapped analog and digital circuitry to process, analyze, and isolate the high-voltage and high-current signals created by the capacitor. Analog filters, rectifiers, and comparators produced pass/fail status signals. A master PC, other measurement and control equipment, the analog circuits, and a six-position carousel were integrated to create the entire automated test and control system.

For each unit under test (UUT), test specifications are obtained from a Manufacturing Execution System (MES) and cached locally. The subsystems at each carousel position are designed to run independently. This parallel capability allows greater throughput and reduced test time per capacitor unit. In addition, as different capacitor models move through the carousel stations, the test parameters and conditions must be aware of the particular model being tested.

Test results for UUT are pushed back to the MES system for record retention and data mining. The existing MES interfaces were retained exactly for the retrofit.

Challenge

All capacitors require 100% testing prior to shipment, so the test system is critical for the facility operation. Two or even three shifts are common depending on production needs and the facility cannot afford any significant downtime. Thus, a challenge was to design and build a test system that worked and was very robust.

Another huge challenge was the lack of documentation on the existing system, requiring a sizable amount of reverse engineering to understand the test system operation before development on the new system could begin.

Furthermore, one of the most important challenges surrounded replacement of substantial amounts of original test equipment before the new test equipment could be installed. Thus, we absolutely had to minimize the time and risk in this upgrade changeover.

Technical Highlights

system-architecture-capacitor-testing

A schematic of the overall system architecture is shown in the figure. The major components of the system are:

  • Master PC for supervisory control and test execution management
  • NI cRIOs with FPGAs and Ethernet for independent yet PC-supervised operation
  • Station-specific FPGA code for replacing wire-wrap circuitry functionality
  • Integration with existing MES, safety equipment, tooling, and measurement hardware

The architecture chosen was made very modular by the capabilities offered by the cRIO. The Master PC interfaced with station-specific measurement instrumentation as needed, such as GPIB controlled equipment, and coordinated control and outcomes from the cRIOs. This additional equipment is not shown in the figure.

Solution

The Master PC coordinated all the activities including interfacing with the existing MES database and printers at the manufacturing facility. In addition, this PC provided the operator interface and, when needed, access to engineering screen on a diagnostic laptop.

The cRIOs were essential to the success of this test system. Each cRIO functioned as the equivalent of a high-speed standalone instrument.

The cRIOs at each carousel test position had to provide the following features:

  • Digital I/O for machine feedback, safeties, and fault conditions
  • State machines to coordinate with external commands and signals
  • Perform numeric calculations to emulate the old analog circuitry
  • Control loops for currents associated with voltages needed by different capacitors
  • Communication support with the master PC
  • Computation and detection of internal fault and UUT pass/fail conditions

We were able to duplicate the behavior of the wire-wrapped circuitry by converting the schematic diagrams of these circuits into FPGA code and then tweaking that code to mimicking the actual signals we measured with data acquisition equipment on the original test hardware.

The outputs of the circuitry were reconstructed on the FPGA with band-pass filtering, calibration compensation, point-to-point RMS, and phase & frequency functions. This functionality was implemented in fixed-point math and the 24-bit inputs on the A/D provided sufficient resolution and bandwidth for a faithful reproduction of the electronic circuitry. These embedded cRIOs provided a very effective solution to what otherwise might have required another set of costly and rigid custom circuits.

Finally, for optimizing the task of replacing the old equipment, we used a set of cRIOs, not shown in Figure 1, to provide Hardware-In-the-Loop (HIL) simulation of the manufacturing and measurement equipment. These cRIOs imitated the rest of the machine by providing inputs to and reacting to outputs from the embedded cRIO controllers, thus supporting comprehensive verification of the new test system before the tear-out of the existing hardware. Furthermore, these HIL cRIOs enabled fault injection for conditions that would have been difficult and possibly dangerous to create on the actual equipment.

Yes, I need a manufacturing test system »

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