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Greetings,
As we prepare for the holiday season
and the start of 2010, on behalf of all of us at Viewpoint Systems,
I would like to wish you all a happy holiday and splendid new year.
We recently attended a seminar, presented
by assistant professor Marcos Esterman of the Industrial & Systems
Engineering Department at Rochester Institute of Technology (RIT), on
integrating data measured during product design, reliability test, and
manufacturing test as a means of predicting the costs and causes of
warranty returns. As you know, we are passionate about data management
in all of its forms and we’ve been in discussion with Dr. Esterman
regarding possible collaborative efforts. If you find yourself
confronting these types of data management issues and would like to
be a part of the conversation we would love to hear from you!
This month continues the series on 7 Challenges for Highly Effective
Test Engineers with an exploration
of Test Engineering Proficiency
Thanks for reading!
Jim Campbell
jac@viewpointusa.com |
Test Engineering Proficiency
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We continue exploring the ‘7
Challenges for Highly Effective Test Engineers’ which are challenges
that affect all test engineers developing new test systems or upgrading
old ones.
Last month, I continued the exploration
of these 7 Challenges with a discussion of Development Tools. This month’s
Challenge covers Engineering Proficiency. Next month we will look into
Resource Limitations.
Last month’s Challenge of Development
Tools dovetails nicely into this month’s Challenge. Test engineers
have an ever-growing toolbox to apply to test system development. Half
of this month’s theme is becoming and staying proficient with these
tools. The other half is the skills to know when to use these
tools. Available hardware and software choices play a critical
role, and define your toolset, but which one dominates your toolset
selection? I have some strong recommendations,
read on to see if you agree.
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Early Visionary of the Web |
One of the first attempts to develop a framework to connect information was made by Paul Otlet, an information-science pioneer. Otlet suggested that documents only have meaning once they are interlinked as a “web” of information. Building off of other’s work, he used components of the card catalog system and the decimal classification system and developed a faceted classification system. Although his work was inadequate compared to the “Google’s” of today, many view Otlet’s work as a protoype of the World Wide Web and the hyperlink.
Otlet’s work was supported for a brief time and at one point he had a catalog of 15 million index cards and tons of documents. This collection of information sustained a small research business, which would collect a fee for queries. Approximately 1,500 queries a year were handled by mail and telegram. A number of setbacks pushed his work into obscurity and on December 10, 1944 Paul Otlet died. Read more about Otlet’s work.
Read more about Otlet's work.
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To register, visit
ni.com/training
or call 585-475-9555.
LabVIEW Core
Core 1
3 days, Jan 25 - Jan 27, 2010
$1799
Core 2
2 days, Jan 28 - Jan 29, 2010
$1199
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LabVIEW Intermediate
Intermediate I
3 days, Feb 1 - Feb 3, 2010
$1799
Intermediate II
2 days, Feb 4 - Feb 5, 2010
$1199
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LabVIEW Advanced I: Architectures
3 days, Feb 8 - Feb 10, 2010
$2099
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Managing Software Engineering in LabVIEW
2 days, Feb 11 - Feb 12, 2010
$1499
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All classes are held at Viewpoint’s Certified Training Center in Rochester.
Don’t see
a course listed here?
Call 585-475-9555 or review our complete training schedule to learn
about other courses offered by National Instruments and Viewpoint Systems. Viewpoint
can also custom tailor a training course to meet your company needs.
About Viewpoint Systems
We are consultants, designers, and builders of custom automated product test platforms for design validation, reliability, manufacturing and data management.
Viewpoint is dedicated to increasing the competitive advantage of our regional product design and manufacturing community in a global economy.
Newsletter Staff:
Editor-In-Chief: James Campbell
Senior Editor: Benjamin Hysell
Associate Editor: Sunny Teumim
© 2009 Viewpoint Systems, Inc.
All rights reserved.
Product and company names listed are trademarks or trade names of their respective
companies.
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